Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials : 10

(Autor) Otwin Breitenstein
Formato: Hardcover
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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

Information
Editorial:
Springer International Publishing AG
Formato:
Hardcover
Número de páginas:
None
Idioma:
en
ISBN:
9783319998244
Año de publicación:
2019
Fecha publicación:
22 de Enero de 2019

Otwin Breitenstein

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