Electrothermal Analysis of VLSI Systems
(Autor) Yi-Kan Cheng
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Paperback
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This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
Information
Editorial:
Springer-Verlag New York Inc.
Formato:
Paperback
Número de páginas:
None
Idioma:
en
ISBN:
9781475773736
Año de publicación:
2013
Fecha publicación:
20 de Abril de 2013