Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials : 10
(Author) Otwin Breitenstein
Format:
Hardcover
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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
Information
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Format:
Hardcover
Number of pages:
None
Language:
en
ISBN:
9783642024160
Publish year:
2010
Publish date:
Sept. 5, 2010