Electrothermal Analysis of VLSI Systems
(Author) Yi-Kan Cheng
Format:
Paperback
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This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
Information
Publisher:
Springer-Verlag New York Inc.
Format:
Paperback
Number of pages:
None
Language:
en
ISBN:
9781475773736
Publish year:
2013
Publish date:
April 20, 2013